리퍼비시 계측기
RF tests for LTE-Advanced DL CA, LTE, 2G and 3G terminals
Market-leading TD-SCDMA functionality including HDPA and HSDPA Evolution
Fast test times for R&D, service and manufacturing
Supports manufacturing including non-signaling UE calibration and functional tests
Backwards compatibility with MT8820A/B
Parallelphone™ measurement option for testing 2 phones at once
Frequency range: 30 MHz to 2.7 GHz
3.4 GHz to 3.8 GHz (with MT8820C-018)
Max. input level: +35 dBm (Main)
Main I/O
Impedance: 50 Ω
VSWfl: ≤1.2 (<1.6 GHz), ≤1.25 (1.6 GHz to 2.2 GHz), ≤1.3 (>2.2 GHz)
Connector: N type
AUX output
Impedance: 50 Ω
VSWfl: ≤1.3 (SG Output level: ≤–10 dBm)
Connector: SMA type
Reference oscillator
Frequency: 10 MHz
Level: TTL
Startup characteristics: ≤±5 × 10–8 (10 min after startup referenced to frequency 24 h after startup)
Aging rate: ≤±2 × 10–8/day, ≤±1 × 10–7/year (referenced to frequency 24 h after startup)
Temperature characteristics: ≤±5 × 10–8
Connector: BNC type
External reference input
Frequency: 10 MHz or 13 MHz (±1 ppm)
Level: ≥0 dBm
Impedance: 50 Ω
Connector: BNC type
008 : LTE Measurement Hardware
012 : Parallel Phone Measurement Hardware
017 : Extended RF Hardware*1
MX882012C : LTE FDD Measurement Software*2 (requires MT8820C-008)
MX882012C-006 : LTE FDD IP Data Transfer
MX882012C-011 : LTE FDD 2×2 MIMO DL