• Highly expandable, plug-in, modular design bit error rate tester (BERT)
• Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
• Supports signal integrity analysis for a variety of 100G+ applications
  • High speed backplane and interconnect
  • High speed chip/device
  • Active optical cable
  • Optical transceiver modules
• High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
• Jitter tolerance test up to 32.1 Gbit/s
  • SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
  • Support generation of dual tone SJ, RJ, BUJ, and SSC
  • Half Period Jitter (Even/Odd Jitter)
• Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
• 32.1 Gbit/s 4Tap Emphasis with external MP1825B
• Crosstalk test and skew tolerance test using synchronized multi-channel PPG
• Passive Linear Equalizers for improved EYE opening
• Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
• 32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
• 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)

MU181020B -002  0.1 to 14 Gbit/s

MU181040B -002  0.1 to 14 Gbit/s